eSeminars

The Impact of Clock Recovery on Your Serial Data Measurements (On-Demand Webcast)  †

Speaker:  Steve Sekel, Director, Product Management

Hosted by EDN - APRIL 2008
ON-DEMAND WEBCAST – Registration required.

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Transmitter Jitter Basics: Two Worlds of Test
(On-Demand Webcast) †

Speaker: Charlie Schaffer, Marketing Vice President

Hosted by LIGHTWAVE • JAN 2008
ON-DEMAND WEBCAST – Registration required.

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Pass PCI Express Physical Layer Compliance Testing
the First Time (On-Demand Webcast)  †

Speaker: Bent Hessen-Schmidt, Vice President, Business Development

Hosted by Test & Measurement World and EDN • DEC 2007
ON-DEMAND WEBCAST – Registration required.

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Combating Closed Eyes – Design & Measurement of
Pre-Emphasis and Equalization for Lossy Channels
(On-Demand Webcast) †

Speaker: Tom Waschura, Co-founder and Chief Technology Officer

Hosted by EDN • OCT 2007
ON-DEMAND WEBCAST – Registration required.

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