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BERTScope S 12.5/7.5 Gb/s Analyzers with Stressed Eye
The BERTScope S has everything you will need to perform
receiver compliance testing, transmitter compliance testing, and advanced analysis.
Featuring easy and flexible stress testing, physical layer analysis such as BER Contour
and Jitter measurements, and a Compliance Contour view for Mask Test, it represents
a breakthrough in insight and saved development time. Compliance Contour is a
bridge between BER and mask testing, needed because of the requirements of standards
such as OIF CEI and XFP/XFI. These new standards require compliance to masks at
BER levels of 10-12, a feat
beyond the capabilities of a sampling oscilloscope.
BERTScope bridges the gap between eye diagram analysis with BER
pattern generation. Finally, bit error ratio detection can be performed quickly, accurately,
and thoroughly. BERTScope samples data and enables you to easily isolate problematic
bit and pattern sequences. Seven types of advanced error analysis are built into one
robust solution for unprecedented statistical measurement depth.
For serial data applications, the new model BERTScopes provide
great flexibility in clocking. This includes many new clock divide ratios, in addition
to the ability to add stress to an external
clock — even one with spread spectrum
clocking imposed on it. Jitter tolerance testing is now a snap with onboard template
testing. It all adds up to an even smarter way of getting your job done the fastest
way possible.
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Key Features of BERTScope B Model Stressed Analyzers: |
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- Comprehensive range of differential divided clock outputs
for supplying test devices with an instrument grade clock
- External clock input upgraded to allow imposition
of stress
- Analysis (using clock recovery if desired) of
signals with SSC
- Analysis of physical layer parameters such as eye
diagrams and jitter while input signal has SCC on it
- BER measurements down to 100 Mb/s, operable with the
internal clock or an external clock
- Variable depth eye and mask measurements, to allow
correlation with shallow sampling scope measurements or a deeper, more revealing
view of device performance
- Optical measurement units for eye diagrams with an
external optical reference receiver
- Active measurement and graphing of BERTScope clock
recovery loop bandwidth and peaking
- Jitter tolerance compliance template testing with
margin testing
- The 12500B Analyzer offers greater than 20 GHz bandwidth
for superior jitter, Q-factor, and eye measurement accuracy and fidelity
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Additional features of BERTScope Stressed Analyzers: |
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- High Speed BER Measurements
- Integrated, Calibrated Stress Generation
- Sinusoidal Jitter to 80 MHz
- Random Jitter
- Bounded Uncorrelated Jitter
- Sinusoidal Interference
- Electrical Stressed Eye Testing for:
- XFP/XFI
- OIF/CEI
- Fibre Channel
- Serial ATA I/O
- etc.
- Optical Stressed Eye Testing for:
- 10 Gb Ethernet
- 1, 2, 4, 8x Fibre Channel
- 1 Gb Ethernet
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- Integrated Eye Diagram Analysis with
BER Correlation
- Physical Layer Test Suite with Mask Testing, Jitter
Peak, BER Contour, and
Q-Factor Analysis
- Compliant Contour Test for Mask Performance Evaluation
to BER 10-12, as called for by latest
standards including XFP/XFI and OIF-CEI
- BitAlyzer Error Location Analysis™
- Pattern Sensitivity Analysis
- Error Free Interval Analysis for periodic
jitter identification
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The BERTScope Analyzer Family
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Ordering Information: |
| Product Code |
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Description |
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| BSA12500B |
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BERTScope S 12.5 Gb/s Stressed Pattern Generator and Error Analyzer |
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| BSA7500B |
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BERTScope S 7.5 Gb/s Stressed Pattern Generator and
Error Analyzer |
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Extended warranty and product upgrade options
are available.
To learn more about how BERTScope can meet your testing needs, or to
schedule a demonstration in your lab, contact our
Sales Engineers.
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